Eric D. Ha

Assistant Professor Office: 2430 - Physical Science Bldg
Phone: 217-581-3220
Phone: 217-581-3220
Email: dha@eiu.edu
Website: https://sites.google.com/site/dongheonha/home

INTRODUCTION

Dongheon Ha (Ph.D., Maryland) is an Assistant Professor in the Departments of Physics and Electrical Engineering at the Eastern Illinois University (EIU). He received his Ph.D. in Electrical Engineering from the University of Maryland and was a Postdoctoral Fellow in the Physical Measurement Laboratory (PML) and the Center for Nanoscale Science and Technology (CNST) at the National Institute of Standards and Technology (NIST) in Gaithersburg, MD. His research endeavors range from optics, photonics, electronics, nanomaterials, nanofabrication, and nanoscale measurement techniques to renewable solar energy harvesting. 

Prior to his doctoral study at Maryland, he also worked at the SK Hynix Semiconductor, the world’s 2nd largest memory semiconductor manufacturer, after completion of his studies at the Korea Advanced Institute of Science and Technology (KAIST). As a Staff Engineer, he developed novel semiconductor devices and circuits for consumer electronic devices, including cell phones, laptop computers, servers, and others. 

He has numbers of publications in leading scholastic high impact journals, including Advanced Energy Materials, Nano LettersNano EnergyAdvanced Electronic Materials, ACS Applied Materials and Interfaces, and others. At EIU, he leads multiple research projects in renewable energy and nanoscale physics and technology such as: development high-efficiency solar energy devices; development of novel photonic and electronic materials; development of novel nanoscale measurement systems using an atomic force microscope (AFM) and an optical microscope, etc

He has received the Graduate Dean’s Dissertation Fellowship, the Future Faculty Fellowship, the Ann G. Wylie Fellowship, the International Teaching Fellowship, and the Distinguished Teaching Assistant Award at the University of Maryland. He is a member of the American Physical Society (APS), the Materials Research Society (MRS), and the Society of Photographic Instrumentation Engineers (SPIE).